Advanced Characterization Techniques

advanced-characterization-techniques

Syllabus

Faculty: Dr. Tapan Dash

Course Name: Advanced Characterization Techniques

Code(Credit) :CUTM1402(3-1-0)

Course Objectives

The objective of the subject is that the student acquires knowledge of the different existing experimental techniques for the microstructural and physicochemical characterizations of materials.
Students gain knowledge about the principles of various techniques.

Learning Outcomes

Upon successful completion of this course, students will be able to address following points:

Depending on the problem or needs of each case, the student must have sufficient criteria to select the most appropriate technique, as well as the interpretation of their results.
The knowledge gained from this subject definitely help students to optimize material research.

Course Syllabus

Module-I
Compositional and Structural Characterization
Principle of X-ray diffraction (XRD), Importance of Rietveld refinement in XRD (fundamental), Lattice parameters, Structure analysis, Phase identification, Crystallite size analysis using Scherrer's formula, X-ray photoelectron spectroscopy (XPS), X-ray fluorescence (XRF), Energy dispersive X-ray analysis (EDAX).
Practice-1
Crystal structure and phase identification determination by XRD (Biovia MS and phase identification by using relevant software)
Practice-2
Study on molecular spectroscopy by fluorescence instrument
Module-II
Advanced Microscopy Techniques for Nanomaterials
Field emission scanning electron microscope (FESEM), Atomic force microscopy (AFM), Scanning tunneling microscopy (STM), Transmission electron microscopy (TEM), High-resolution transmission electron microscopy (HRTEM).
Module-III
Spectroscopic Techniques
Ultraviolet-visible spectroscopy, Photo-luminescence spectroscopy, Fourier transform infrared (FTIR) spectroscopy, Raman spectroscopy, Nuclear magnetic resonance (NMR).
Practice-3
Familiarization with the ultraviolet-visible absorption spectroscopy
Practice-4
Band gap calculation from p
hoto-luminescence
spectra
Module-IV
Nanomaterials Electrical and Magnetic C
haracterization
Techniques
Measurement of resistivity by 4-probe method, Hall measurement, Measurement of magnetic of properties of nanomaterial (Magnetic hysteresis and dielectric properties by LCR meter),Vibrating sample magnetometer.
Module-V
Mechanical Characterization Techniques
Elastic and plastic deformation-mechanical properties of materials, models for interpretation of nanoindentation load-displacement curves, Nanoindentation data analysis methods-Hardness testing of thin films and coatings, Mechanical properties evaluation by universal testing machine (UTM), Dynamic mechanical analysis.
Practice-5
Evaluation of mechanical properties of material by nanoindentation technique
Practice-6
Measurement of tensile strength of material by UTM
Module-VI
Physical and Optical Characterizations of Nanostructured Materials
Introduction to particle size characterization, Zeta potential measurement – Particle size analysis, specific surface area by BET analysis, Photoconductivity.
Module-VII
Thermal and Electrochemical Characterization
Differential scanning calorimeter (DSC), Differential thermal analyzer (DTA), Thermogravimetric analysis (TGA), Electrochemical analysis (Charging-discharging cyclic voltammetry).
Reference Books:
1. ASM Handbook: Materials Characterization, ASM International, 2008.
2. Yang Leng: Materials Characterization-Introduction to Microscopic and Spectroscopic Methods, John Wiley & Sons (Asia) Pte Ltd., 2008.
3. Robert F. Speyer: Thermal Analysis of Materials, Marcel Dekker Inc., New York, 1994.
4. Nanotechnology-Basic Science and Emerging Technologies, Mick Wilson, Kamali Kannangra Geoff Smith, Michelle Simons and Burkhard Raguse, Overseas Press.

Session Plan

Session 1

Principle of X-ray diffraction (XRD), Importance of Rietveld refinement in XRD (fundamental), Lattice parameters, Structure analysis, Phase identification, Crystallite size analysis using Scherrer's formula
https://www.youtube.com/watch?v=IsaTx5-KLT8
https://www.youtube.com/watch?v=C1cYJthlBZY
https://slideplayer.com/slide/3866732/
https://courseware.cutm.ac.in/files/2015/02/Lesson-1-XRD-and-Rietveld-Refinement.pdf

Session 2

Practice-1 (2 hours)
Crystal structure and phase identification determination by XRD (Biovia MS and phase identification by using relevant software)
http://vlab.amrita.edu/?sub=1&brch=282&sim=370&cnt=1